Absolute Analysis Introduces Revolutionary Mid-bus Probing Technology for Testing Multi-Lane Serial Designs

Newbury Park, CA (PRWEB) May 09, 2012 Absolute Analysis today announced the release of the Embedded Systems Probe (ESP) designed to connect to a mid-bus probe connector to monitor serial signals across backplanes using Serial RapidIO and PCI Express. This ground breaking technology effectively uses one touch-point on the device under test to distribute the […]

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