Probing

Wafer-scale Device Probing is Now Possible in a 3D-controlled Magnetic Field

Blacksburg, VA (PRWEB) December 13, 2011 MicroXact Inc. introduces the new MPS-C-300 and MPS-C-350 magnetic probe stations. With arbitrary user-defined orientation and profile of the applied magnetic field these affordable probe stations provide unmatched throughput and characterization capabilities for spintronic and magneto-electronic devices and circuits. These first-of-their-kind systems offer wafer-size testing capabilities with convenient and […]

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Absolute Analysis Introduces Revolutionary Mid-bus Probing Technology for Testing Multi-Lane Serial Designs

Newbury Park, CA (PRWEB) May 09, 2012 Absolute Analysis today announced the release of the Embedded Systems Probe (ESP) designed to connect to a mid-bus probe connector to monitor serial signals across backplanes using Serial RapidIO and PCI Express. This ground breaking technology effectively uses one touch-point on the device under test to distribute the

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