Particle Impact Noise Detection Finds Non-Authentic Electronic Components

Clifton, NJ (PRWEB) August 01, 2011

Joseph Federico, NJMET vice president, announced that testing by the company has found dangerous counterfeit components in two separate customer orders. In both cases, NJMETs testing revealed weak wire bonds which could have ultimately caused the devices to short during use.

These counterfeit parts were discovered using a combination of visual internal analysis and Particle Impact Noise Detection (PIND).

Particle Impact Noise Detection (PIND) is used to determined the integrity of electronic components by “listening” for the acoustic signals generated by impacts created by loose particles inside the cavities of electronic components such as transistors, integrated circuits, hybrids, diodes, relays and switches. This reliability screening technique employs vibration, shocks, and acoustics and has helped the manufacturers of hermetically sealed electronic components greatly increase the reliability of their products by eliminating contaminants within the cavity.

Over the past year, Joseph Federico and NJMET’s active participation in military and aerospace testing forums has lead to the identification of additional requirements that these industries have imposed as specialized tests to uncover non-authentic electronic component products.

For nearly nine years, Joseph Federico, vice president and director of operations at NJMETs laboratory in NJ, has led a state of the art testing program validating electronic part authenticity called Mission Imposter

About The Author

Ibrar Ayyub

Ibrar Ayyub is an experienced technical writer with a Master's degree in computer science from BZU Multan University. He has written for various industries, mainly home automation, and engineering. He has a clear and simple writing style and is skilled in using infographics and diagrams. He is a great researcher and is able to present information in a well-organized and logical manner.

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