Summary of ATP Introduces Enterprise Grade DRAM Modules Featuring Elevated Temperature Burn In Testing
ATP Electronics launched Enterprise Grade DRAM Modules for mission-critical applications, featuring a patent-pending Elevated Temperature Burn In Testing System. This system screens for fringe defects and IC infant mortality using flexible thermal profiles and SCADA monitoring. The modules are showcased alongside PowerProtector Technology at the Intel Developer Forum to ensure reliability in industrial and enterprise environments.
Parts used in the Enterprise Grade DRAM Modules:
- Enterprise Grade DRAM Modules
- Elevated Temperature Burn In Testing System
- Thermal Chamber
- SCADA (Supervisory Control and Data Acquisition) System
- PowerProtector Technology
- Back up power circuit
- Controller
- NAND flash memory
Sunnyvale, CA (PRWEB) September 13, 2011
ATP, a leading memory manufacturer known for its high quality, highly reliable flash and DRAM memory modules, announced the addition of its newest product line, Enterprise Grade DRAM Modules for mission critical applications. The new line of DRAM modules is tested under ATPs patent pending Elevated Temperature Burn In Testing System, significantly increasing module level quality by screening for fringe defects that may not be caught with traditional testing processes.
The Elevated Temperature Burn In System features a unique chamber design allowing for flexibility in customer specific temperature profiles and also features a flexible monitoring/control system. The elevated temperature burn in process reduces field failures due to fringe manufacturing defects and IC infant mortality. The design of the thermal chamber allows for a higher level of production level efficiency, scalability, and flexibility. The patent pending SCADA (Supervisory Control and Data Acquisition) feature of the burn in system allows for true flexibility in application/customer specific temperature profiles and data patterns (customer specific software/scripts). SCADA also offers real time monitoring and production lot logging for QA traceability.
It took several process generations of elevated thermal testing for ATP to come out with a system scalable and efficient enough to support this Enterprise Grade product line without a significant cost or production lead time impact. In addition, with flexibility in data patterns, thermal profiles, and even motherboard designs, we can truly meet the application and project specific requirements of strategic OEM customers, said Jeff Hsieh, ATP Director of Business Development.
ATP Electronics will be showcasing their new Enterprise Grade DRAM modules with Elevated Temperature Burn in Testing System along with the recently released PowerProtector Technology at the Intel Developer Forum (Booth 523), September 13th-15th at the Moscone Center in San Francisco. ATPs PowerProtector technology guarantees reliable controller and lasting NAND flash operation with a back up power circuit during a power outage and supports multiple form factors, wider temperature ranges and longer life spans, exceeding the performance of existing super cap designs.
About ATP
ATP Electronics is a leading manufacturer of high performance, high quality and durable NAND flash memory solutions as well as DRAM memory modules. With over twenty years of experience in the design, manufacturing and support of memory products, ATP continues to focus on mission critical applications such as industrial, telecom, medical and enterprise computing where high levels of technical support, performance consistency and wide operating temperature ranges are required. As a true manufacturer, ATP offers in house design, testing and product tuning. ATP also offers extensive supply chain support with controlled/fixed BOMs and long product life cycles. For more information on ATP products please visit http://www.atpinc.com or contact sales(at)atpinc(dot)com.
Contact:
Samina Subedar
saminas(at)us(dot)atpinc(dot)com
(408) 732 5876
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- What is the purpose of the Elevated Temperature Burn In Testing System?
The system significantly increases module level quality by screening for fringe defects that traditional testing processes may miss. - How does the SCADA feature benefit production?
It allows for true flexibility in application-specific temperature profiles and offers real-time monitoring and production lot logging for QA traceability. - Can the burn-in system support specific customer requirements?
Yes, it features unique chamber design allowing for flexibility in customer-specific temperature profiles and data patterns. - Does the new product line impact cost or lead time?
No, ATP developed a scalable and efficient system to support this line without significant cost or production lead time impact. - What technology guarantees reliable operation during a power outage?
PowerProtector Technology guarantees reliable controller and lasting NAND flash operation with a back up power circuit. - How does PowerProtector compare to existing super cap designs?
It exceeds the performance of existing super cap designs by supporting multiple form factors, wider temperature ranges, and longer life spans. - Where can customers view these new products in September 2011?
Customers can view them at the Intel Developer Forum at the Moscone Center in San Francisco from September 13th-15th. - Which industries require the high levels of technical support offered by ATP?
ATP focuses on mission-critical applications such as industrial, telecom, medical, and enterprise computing.
