Wafer-scale Device Probing is Now Possible in a 3D-controlled Magnetic Field
Blacksburg, VA (PRWEB) December 13, 2011 MicroXact Inc. introduces the new MPS-C-300 and MPS-C-350 magnetic probe stations. With arbitrary user-defined orientation and profile of the applied magnetic field these affordable probe stations provide unmatched throughput and characterization capabilities for spintronic and magneto-electronic devices and circuits. These first-of-their-kind systems offer wafer-size testing capabilities with convenient and […]
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