Test

New XJTAG Chain Debugger Cuts Circuit Debug and Test Times

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CAMBRIDGE, England (PRWEB) November 23, 2005 XJTAG (http://www.xjtag.com), a leading supplier of boundary scan development tools, has added a JTAG chain debugger to its XJTAG Development System, which will further reduce debug and test times for engineers designing and testing complex printed circuit boards. The JTAG chain debugger features a range of debug options […]

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Briton EMS Opts for XJTAG Boundary Scan to Remove Guesswork from Test Equation

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CAMBRIDGE, England, (PRWEB) February 18, 2006 Briton EMS (http://www.britonems.co.uk), a UK based contract electronics manufacturer, has selected the XJTAG development system as its boundary scan test solution. The XJTAG system has been implemented at Briton EMSs production facility at Bedford, England, and will enable the manufacturer to rapidly pinpoint faults on complex and expensive printed

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Solarflare Selects XJTAG Boundary Scan to Debug and Test Ethernet Network Cards

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CAMBRIDGE, England (PRWEB) July 12, 2006 Solarflare Communications, a fabless semiconductor company that provides high-performance Ethernet solutions, has selected the XJTAG boundary scan solution to debug and test its EtherFabric EF1-21022T Network Interface Cards (NICs). The XJTAG system is being used by Solarflare for debugging and testing development boards at its R&D centre in Cambridge,

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New Product Release Hybricon’s New OF-12U Open Frame Desktop Test Chassis Supports VITA 46/VPX and VITA 48/REDI

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Ayer, MA (PRWEB) September 23, 2006 Hybricon Corporation announces the release of a new line of open frame desktop test chassis (the OF-XC Series) designed for today’s high power VPX REDI boards. High power boards and systems have been around for a long time; what’s new is that they are moving from the custom realm

New Product Release Hybricon’s New OF-12U Open Frame Desktop Test Chassis Supports VITA 46/VPX and VITA 48/REDI Read More »

CWAV’S USBee DX Test Pod: View Embedded Bus Data with 16 Digital Channels and a 2 Channel Oscilloscope

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Temecula, CA (PRWEB) November 8, 2006 CWAV, a Southern California-based electronics company, announced today the addition of the USBee DX Test Pod (DX) to its product family of PC based test pods that verify analog voltage levels and digital logic used in electronics. The DX builds on CWAV’s award-winning USBee AX Pro Test Pod and

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Integre Technologies Announces Partnership with Test Spectrum

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Rochester, NY (PRWEB) February 13, 2007 Integre Technologies, a leading provider of ASIC design and verification services, today announced their partnership with Test Spectrum Inc., an industry expert in semiconductor test solutions. Test Spectrum is an engineering firm focused on the development of test solutions for the semiconductor industry, and is able to develop

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Data Clean Corporation Offers Test Kit to Aid in the Identification of Tin Whiskers

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Des Plaines, IL (PRWEB) December 6, 2007 Data Clean Corporation now offers a self-administered Tin Whisker test kit to help identify the presence of Tin Whiskers. The Tin Whisker test kit is a natural extension of product offerings from Data Clean, a known specialist in Zinc Whisker identification and remediation.   Tin Whiskers and Zinc

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Kozio Announces it’s New Device Functional Test Automation for Manufacturing

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Longmont, CO (PRWEB) January 31, 2008 Kozio, Inc. (kozio.com), the leading provider of automated hardware functional test for digital circuit boards, announced today its latest product – the kDiagnostics Manufacturing Suite. This new productivity enhancing suite includes the appropriate functional test suites for all core memories, busses and peripheral devices, a complete and thorough automated

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Beagle USB 5000 SuperSpeed Protocol Analyzer Named as a Finalist for Test & Measurement World’s 2012 Best in Test Award

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Sunnyvale, CA (PRWEB) November 14, 2011 Total Phase, a provider of industry-leading USB, I2C, SPI, and CAN embedded systems tools, is proud to announce the selection of the Beagle USB 5000 SuperSpeed Protocol Analyzer as a finalist for the 2012 Best in Test Award. Winners will be announced at DesignCon 2012 on January 31, 2012

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